Patent US 4716564A
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| Patent number | US 4716564A |
|---|---|
| Title | Method for test generation |
| Inventors | Angelo C. J. Hung, Francis C. Wang |
| Company | Tektronix Inc |
| Filing date | 1985-11-15 |
| Grant date | 1987-12-29 |
| Cites |
| Patent number | US 4716564A |
|---|---|
| Title | Method for test generation |
| Inventors | Angelo C. J. Hung, Francis C. Wang |
| Company | Tektronix Inc |
| Filing date | 1985-11-15 |
| Grant date | 1987-12-29 |
| Cites |